X-ray fluorescence (XRF)
X-Ray Fluorescence (XRF) is the emission of characteristic “Secondary” (or Fluorescent) X-Rays from a material that has been excited by bombarding with high-energy X-Rays or Gamma Rays . The phenomenon is widely used for elemental analysis and chemical analysis , particularly in the investigation of metals , glass , ceramics and building materials, and for research in geochemistry , forensic science and
archaeology .
An X-ray Fluorescence (XRF) Spectrometer is an X-Ray Instrument used for routine, relatively non-destructive chemical analyses of rocks, minerals, sediments and fluids. It works on wavelength-dispersive spectroscopic principles that are similar to an Electron Microprobe (EPMA). However, an XRF cannot generally make analyses at the small spot sizes typical of EPMA work (2-5 microns), so it is typically used for bulk analyses of larger fractions of geological materials. The relative ease and low cost of sample preparation, and the stability and ease of use of X-Ray Spectrometers make this one of the most widely used methods for analysis of major and trace elements in rocks, minerals, and sediment.
Features
- The first handheld analyzer
- Superior Count Rates and Resolution
- PPM detection limits
- Rapid and Accurate Analysis on materials such as lead (Pb), mercury (Hg), chrome (Cr), cadmium (Cd), and bromine (Br) at part per million levels
- The capabilities of a Bench-Top Instrument, with the convenience of a handheld
- Powerful Laptop-based Analytical Software
- Customizable Filters and secondary targets to optimize analysis
- Live-time Spectral Display
- State of the Art Design that allows the detection of Light Elements such as Mg, Al, Si, S, P and Cl
- Grade Library covers Low Alloy Steel, Tool Steel, Stainless Steel, Nickel Alloys, Cobalt Alloys, Copper Alloys, Aluminum Alloys, Titanium Alloys, Zirconium Alloys and Tungsten Alloys
- Performance equal to any available system using a SiPIN detector
- Covers all common classes of metal